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scanning transmission electron microscope

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Terminological databases

Materjalitehnika terminibaas

ID 675127 Last modified 11.08.2025
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Domain laboratory engineeringmetallography
skaneeriv transmissioonelektronmikroskoop preferred
scanning transmission electron microscope preferred
  • elektronmikroskoop, mille korral kujutist läbivad elektronid ei haju vaadeldavalt uuritavalt objektilt; need kogutakse ja analüüsitakse (vt elektronmikroskoop)
  • electron microscope in which electrons transmitted through the sample are either uncattered, elastically scattered or inelatically scattered; they are collected, separated and analyzed (see: electron microscope)
skaneeriv transmissioonelektronmikroskoop preferred
Good to know
  • lühend STEM
scanning transmission electron microscope preferred
Good to know
  • abbreviation STEM
STEM abbreviation

Metroloogia terminibaas

ID 590388 Last modified 11.04.2024
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Domain metrologymeasuring equipment - control equipmentmeasuring instruments
läbivkiirguse elektronmikroskoop preferred
skaneeriv transmissioonelektronmikroskoop
skaneeriv transmissioonmikroskoop
  • mikroskoop, mis võimaldab kujutise saada tänu uuritavat proovi läbivale elektronide voole
  • microscopy technique in which a beam of electrons is transmitted through a specimen to form an image
  • type of transmission electron microscope
läbivkiirguse elektronmikroskoop preferred
Usage examples
  • Läbivkiirguse elektronmikroskoobis fokuseeritakse elektronkiir väikesele täpile (tüüpiline täpi läbimõõt 0,05 nm kuni 0,2 nm), mis seejärel skaneeritakse üle proovi rastervalgustussüsteemis, mis on konstrueeritud nii, et proov valgustatakse igas punktis optilise teljega paralleelse kiirega, mis muudab läbivkiirguse elektronmikroskoobi sobivaks analüütiliste meetodite jaoks, nagu Z-kontrastne rõngakujuline tumeda välja pildistamine ja spektroskoopiline kaardistamine energia dispersiivse röntgenspektroskoopia või elektronide energiakao spektroskoopia abil.
skaneeriv transmissioonelektronmikroskoop
skaneeriv transmissioonmikroskoop
scanning transmission electron microscope
Usage examples
  • In scanning transmission electron microscope the electron beam is focused to a fine spot (with the typical spot size 0,05 nm – 0,2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis. The rastering of the beam across the sample makes scanning transmission electron microscope suitable for analytical techniques such as Z-contrast annular dark-field imaging, and spectroscopic mapping by energy dispersive X-ray spectroscopy, or electron energy loss spectroscopy.

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