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SEM

1 abbreviation

Terminological databases

Arheoloogia terminibaas

ID 473301 Last modified 08.08.2023
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Domain muud laboriga seotud mõisted
  • mikroskoop, mis loob kujutise uuritavat proovi suure energiaga elektronikiire abil skaneerides. Kiirt moodustavad elektronid interakteeruvad pinda moodustavate aatomitega, tekitades signaale, mis sisaldavad teavet pinna kuju, koostise, elektrijuhtivuse ja muude omaduste kohta. Võimaldab kasutada suuri suurendusi ja uurida väga erinevaid materjale

Materjalitehnika terminibaas

ID 672955 Last modified 07.04.2024
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Domain metallography
  • elektronmikroskoop, mille korral kujutis saadakse objekti skaneerimisel elektronkiirte abil
  • an electron microscope in which a beam of electrons sweeps over a specimen measuring intensity of secondary electrons generated at the point of impact of the beam on the specimen, and relaying the signal into a cathode display, which is scanned in synchronism with the scanning of the specimen
skaneeriv elektronmikroskoop
Good to know
  • lühend SEM
scanning electron microscope preferred
Good to know
  • abbreviation SEM
SEM abbreviation
scanning microscope

Metroloogia terminibaas

ID 1143092 Last modified 29.01.2026
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Domain metrologymeasuring procedures
  • pinnatopograafia mõõtemeetod, mille puhul pinna lokaalsed konarused hinnatakse peegelduse nurkjaotuse või sekundaarse elektronkiirguse intensiivsuse abil ja pinnatopograafia kujutis saadakse nende kohalike pinnakonaruste integreerimise teel
  • surface topography measurement method whereby local gradients of a surface are determined by angular distribution of reflection or secondary electron emission intensity and an areal-topography image is obtained by integration of these local gradients
nurgalahutusega skanniv elektronmikroskoopia
Usage examples
  • Nurgalahutusega skanniva elektronmikroskoopia korral kogutakse katoodiluminestsentsi emissioon paraboloidpeeglisse tulevast täiskiirest ja iga saadud pildi punkt vastab ainulaadsele emissiooninurgale.
SEM abbreviation
angle-resolved scanning electron microscopy
Usage examples
  • In angle-resolved scanning electron microscopy, the cathodoluminescence emission is collected from the full beam incident on a paraboloid mirror, and each point in the resulting image corresponds to a unique emission angle.
SEM abbreviation

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