en

scanning force microscope

1

Terminological databases

Metroloogia terminibaas

ID 610976 Last modified 09.05.2025
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Domain metrologymeasuring instruments
teravikmikroskoop preferred
atomic force microscope preferred
AFM
scanning force microscope
SFM
  • mõõtevahend, mida kasutatakse pinna aatomistruktuuri kaardistamiseks, mõõtes jõudu, mis toimib üle pinna liigutatava kompimisosise väga peenele otsale
  • device used to map the atomic structure of a surface by measuring the force acting on the very fine tip of a wire moved over the surface
teravikmikroskoop preferred
Usage examples
  • Teravikmikroskoopi kasutatakse kompimisosise teraviku ja proovi vaheliste jõudude mõõtmiseks nende vastastikuse eraldamise funktsioonina, mida saab rakendada jõuspektroskoopia tegemiseks ja proovi kombatava pinna mehaaniliste omaduste mõõtmiseks.
atomic force microscope preferred
Usage examples
  • The atomic force microscope can be used to measure the forces between the probe and the sample as a function of their mutual separation. This can be applied to perform force spectroscopy, to measure the mechanical properties of the sample.
AFM abbreviation
scanning force microscope
SFM abbreviation

Metroloogia terminibaas

ID 1143103 Last modified 29.01.2026
View dataset
View dataset
Domain metrologymeasuring procedures
aatomjõumikroskoopia preferred
AFM
skanniv jõumikroskoopia
SFM
atomic force microscopy
AFM
scanning force microscope
SFM
  • pinnatopograafia mõõtemeetod, mille puhul pinna kõrgust tajutakse varb-/nõelotsaku ja pinna vahelise mehaanilise tõmbe- või tõukejõu põhjal
  • surface topography measurement method whereby the surface height is sensed from the mechanical force of attraction or repulsion between a probe tip and a surface
aatomjõumikroskoopia preferred
Usage examples
  • Aatomjõumikroskoopia ja skanniv jõumikroskoopia on kaks meetodit, mida võib liigitada ka skanniva sondi mikroskoopia meetoditeks.
AFM abbreviation
skanniv jõumikroskoopia
SFM abbreviation
atomic force microscopy
Usage examples
  • Atomic force microscopy (AFM) and scanning force microscopy (SFM) are two methods that can also be classified as methods of scanned probe microscopy.
AFM abbreviation
scanning force microscope
SFM abbreviation

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