en

atomic force microscope

1

Terminological databases

Metroloogia terminibaas

ID 610976 Last modified 09.05.2025
View dataset
View dataset
Domain metrologymeasuring instruments
  • mõõtevahend, mida kasutatakse pinna aatomistruktuuri kaardistamiseks, mõõtes jõudu, mis toimib üle pinna liigutatava kompimisosise väga peenele otsale
  • device used to map the atomic structure of a surface by measuring the force acting on the very fine tip of a wire moved over the surface
teravikmikroskoop preferred
Usage examples
  • Teravikmikroskoopi kasutatakse kompimisosise teraviku ja proovi vaheliste jõudude mõõtmiseks nende vastastikuse eraldamise funktsioonina, mida saab rakendada jõuspektroskoopia tegemiseks ja proovi kombatava pinna mehaaniliste omaduste mõõtmiseks.
atomic force microscope preferred
Usage examples
  • The atomic force microscope can be used to measure the forces between the probe and the sample as a function of their mutual separation. This can be applied to perform force spectroscopy, to measure the mechanical properties of the sample.
AFM abbreviation
SFM abbreviation

Word forms not available

Etymology not available

Related words not available

Search the same word

in the EU's IATE term base

Web examples

Online Language Learning Tool SkELL allows users to search for phrases in sentences, collocates and similar words. These examples have been automatically selected and may contain errors.