en

probe tip

1

Terminological databases

Metroloogia terminibaas

ID 630297 Last modified 19.04.2024
View dataset
View dataset
Domain metrologymeasuring instruments
  • mõõtevahendi osis, mis on kasutusel skaneerivates mikroskoopides mõõteobjekti pinna skaneerimiseks ning pindadest ja struktuuridest nanoskaalas piltide tegemiseks
  • instrument that use in scanning probe microscopes to scan the surface of a sample and make nano-scale images of surfaces and structures
teravikkatsur
Usage examples
  • Teravikkatsur on paigaldatud sondkonsooli otsa ja tema otsak võib olla sama terav kui üks aatom, kusjuures mikroskoopias teravikkatsuri otsaku pikkus, laius, kuju, kuvasuhe ja tipu tipu raadius ning nii otsaku kui ka sondeeritava pinna koostis ja materjali omadused mõjutavad otseselt teravikkatsuri eraldusvõimet ja pildikvaliteeti.
probe tip
Usage examples
  • The probe tip is mounted on the end of a cantilever and can be as sharp as a single atom. In microscopy, probe tip geometry (length, width, shape, aspect ratio, and tip apex radius) and the composition (material properties) of both the tip and the surface being probed directly affect resolution and imaging quality.

Word forms not available

Etymology not available

Related words not available

Search the same word

in the EU's IATE term base

Web examples

Online Language Learning Tool SkELL allows users to search for phrases in sentences, collocates and similar words. These examples have been automatically selected and may contain errors.
Skell logo