skaneeriv mikroskoop

Terminological databases

ID 590387 Last modified 11.04.2024

Domain metrologymeasuring instruments

skaneeriv elektronmikroskoop preferred

scanning electron microscope preferred

scanning microscope

mikroskoop, mis loob kujutise uuritavat proovi suure energiaga elektronikiire abil skaneerides

type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons

skaneeriv elektronmikroskoop preferred

Usage examples

Kõige tavalisemas skaneeriva elektronmikroskoobi režiimis tuvastatakse sekundaarse elektronkiire ergastatud aatomite poolt eralduvad sekundaarsed elektronid sekundaarse elektrondetektori abil.

skaneeriv mikroskoop

scanning electron microscope preferred

Usage examples

In the most common scanning electron microscope mode, secondary electrons emitted by atoms excited by the electron beam are detected using a secondary electron detector.

scanning microscope

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