et

skaneeriv elektronmikroskoop

1

Terminological databases

Arheoloogia terminibaas

ID 473301 Last modified 08.08.2023
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Domain muud laboriga seotud mõisted
SEM
SEM
  • mikroskoop, mis loob kujutise uuritavat proovi suure energiaga elektronikiire abil skaneerides. Kiirt moodustavad elektronid interakteeruvad pinda moodustavate aatomitega, tekitades signaale, mis sisaldavad teavet pinna kuju, koostise, elektrijuhtivuse ja muude omaduste kohta. Võimaldab kasutada suuri suurendusi ja uurida väga erinevaid materjale
SEM abbreviation
SEM abbreviation

Materjalitehnika terminibaas

ID 672955 Last modified 07.04.2024
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Domain metallography
scanning electron microscope preferred
SEM
сканирующий электронный микроскоп preferred
  • elektronmikroskoop, mille korral kujutis saadakse objekti skaneerimisel elektronkiirte abil
  • an electron microscope in which a beam of electrons sweeps over a specimen measuring intensity of secondary electrons generated at the point of impact of the beam on the specimen, and relaying the signal into a cathode display, which is scanned in synchronism with the scanning of the specimen
skaneeriv elektronmikroskoop
Good to know
  • lühend SEM
scanning electron microscope preferred
Good to know
  • abbreviation SEM
SEM abbreviation
scanning microscope
сканирующий электронный микроскоп preferred

Metroloogia terminibaas

ID 590387 Last modified 11.04.2024
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Domain metrologymeasuring instruments
skaneeriv elektronmikroskoop preferred
scanning electron microscope preferred
  • mikroskoop, mis loob kujutise uuritavat proovi suure energiaga elektronikiire abil skaneerides
  • type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons
skaneeriv elektronmikroskoop preferred
Usage examples
  • Kõige tavalisemas skaneeriva elektronmikroskoobi režiimis tuvastatakse sekundaarse elektronkiire ergastatud aatomite poolt eralduvad sekundaarsed elektronid sekundaarse elektrondetektori abil.
scanning electron microscope preferred
Usage examples
  • In the most common scanning electron microscope mode, secondary electrons emitted by atoms excited by the electron beam are detected using a secondary electron detector.

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