et

orientatsioonkujutismikroskoopia

1

Terminological databases

Materjalitehnika terminibaas

ID 1185251 Last modified 19.06.2026
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Domain materials sciencemetallography
  • EBSP-l põhinev skaneeriv elektronmikroskoopia polükristallis erinevate terade orientatsiooni määramiseks (vt skaneeriv elektronmikroskoop)
  • SEM technique using by EBSP for determining and displaying orientations of different grains in polycrystals (see: scanning electron microscope)

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