en

orientation imaging microscopy

1

Terminological databases

Materjalitehnika terminibaas

ID 1185251 Last modified 19.06.2026
View dataset
View dataset
Domain materials sciencemetallography
  • EBSP-l põhinev skaneeriv elektronmikroskoopia polükristallis erinevate terade orientatsiooni määramiseks (vt skaneeriv elektronmikroskoop)
  • SEM technique using by EBSP for determining and displaying orientations of different grains in polycrystals (see: scanning electron microscope)

Word forms not available

Etymology not available

Related words not available

Search the same word

in the EU's IATE term base

Web examples

Online Language Learning Tool SkELL allows users to search for phrases in sentences, collocates and similar words. These examples have been automatically selected and may contain errors.