Paljudes mikroskoobisüsteemides määratakse x-valimi intervall kaamera tajurelementide vahelise kaugusega, mida nimetatakse piksliteks, ja optilise seadistuse suurendusega.
In many microscopy systems the x-sampling interval is determined by the distance between sensor elements in a camera, called pixels, and by the magnification of the optical setup.
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