Paljudes mikroskoobisüsteemides määratakse x-valimi intervall kaamera tajurelementide vahelise kaugusega, mida nimetatakse piksliteks, ja optilise seadistuse suurendusega.
In many microscopy systems the x-sampling interval is determined by the distance between sensor elements in a camera, called pixels, and by the magnification of the optical setup.
