en

atomic force microscopy

1

Terminological databases

Biokeemiasõnastik

ID 457872 Last modified 10.08.2023
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Materjalitehnika terminibaas

ID 671969 Last modified 12.06.2026
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Domain metallography
  • pinna skaneerimismeetod, mispõhineb väga suure lahutusvõimega skaneerival mikroskoobil, mis pinda skaneerides terava otsakuga annab pinna kolmemõõtmelise elektroonse kujutise (vt teravikmikroskoopia)
  • a mechanical profiling method that generates three-dimentional maps of surfaces by scanning an atomically sharp probe attached to a cantilever over a surface (see: scanning probe microscopy)
aatomjõumikroskoopia
atomic force microscopy preferred
AFM abbreviation

Metroloogia terminibaas

ID 1143103 Last modified 29.01.2026
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Domain metrologymeasuring procedures
  • pinnatopograafia mõõtemeetod, mille puhul pinna kõrgust tajutakse varb-/nõelotsaku ja pinna vahelise mehaanilise tõmbe- või tõukejõu põhjal
  • surface topography measurement method whereby the surface height is sensed from the mechanical force of attraction or repulsion between a probe tip and a surface
aatomjõumikroskoopia preferred
Usage examples
  • Aatomjõumikroskoopia ja skanniv jõumikroskoopia on kaks meetodit, mida võib liigitada ka skanniva sondi mikroskoopia meetoditeks.
AFM abbreviation
SFM abbreviation
atomic force microscopy
Usage examples
  • Atomic force microscopy (AFM) and scanning force microscopy (SFM) are two methods that can also be classified as methods of scanned probe microscopy.
AFM abbreviation
scanning force microscope
SFM abbreviation

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