et

AFM

1 abbreviation

Terminological databases

Metroloogia terminibaas

ID 1143103 Last modified 29.01.2026
View dataset
View dataset
Domain metrologymeasuring procedures
  • pinnatopograafia mõõtemeetod, mille puhul pinna kõrgust tajutakse varb-/nõelotsaku ja pinna vahelise mehaanilise tõmbe- või tõukejõu põhjal
  • surface topography measurement method whereby the surface height is sensed from the mechanical force of attraction or repulsion between a probe tip and a surface
aatomjõumikroskoopia preferred
Usage examples
  • Aatomjõumikroskoopia ja skanniv jõumikroskoopia on kaks meetodit, mida võib liigitada ka skanniva sondi mikroskoopia meetoditeks.
AFM abbreviation
SFM abbreviation
atomic force microscopy
Usage examples
  • Atomic force microscopy (AFM) and scanning force microscopy (SFM) are two methods that can also be classified as methods of scanned probe microscopy.
AFM abbreviation
scanning force microscope
SFM abbreviation

Word forms not available

Etymology not available

Related words not available

Search the same word

in the EU's IATE term base
Searching web examples...
Searching translated usage examples...