et

tunnelmikroskoopia

1

Terminological databases

Materjalitehnika terminibaas

ID 676024 Last modified 06.01.2025
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Domain metallography
  • juhtivate pindade uurimistehnika, mis annab elektroonse kujutise resolutsiooniga alla 0,01 nm (vt teravikmikroskoopia)
  • a surface analysis technique for conducting surfaces that provides an image of the physical structure of the surface with resolution less than 0.01 nm (see: scanning probe microscopy)
tunnelmikroskoopia preferred
scanning tunneling microscopy preferred
STM abbreviation

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