et

sekundaarioonmass-spektromeetria

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Terminological databases

Materjalitehnika terminibaas

ID 1185896 Last modified 14.07.2026
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Domain materials science
  • elementide keemilise analüüsi tehnika, mille korral primaarne ioonide voog tekitab sekundaarseid ioone, milliseid analüüsitakse massispektromeetri abil (vt massispektromeeter)
  • technique for elemental chemical analysis wherein the primary ion beam produces secondary ions that are analyzed by mass spectrometer (see: mass spectrometer)
secondary ion mass spectrometry preferred
SIMS

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