pinna skaneerimismeetod, mispõhineb väga suure lahutusvõimega skaneerival mikroskoobil, mis pinda skaneerides terava otsakuga annab pinna kolmemõõtmelise elektroonse kujutise (vt teravikmikroskoopia)
a mechanical profiling method that generates three-dimentional maps of surfaces by scanning an atomically sharp probe attached to a cantilever over a surface (see: scanning probe microscopy)
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