en

STM

2 abbreviation

Terminological databases

Materjalitehnika terminibaas

ID 672573 Last modified 13.08.2025
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Domain metallographylaboratory engineering
  • elektronmikroskoop, mille korral aatomteravik „ujub“ üle skaneeritava pinna (vt elektronmikroskoop, aatomteravik)
    Good to know
    • Aatomteraviku mõõtmed mõne aatomläbimõõdu suurusjärgus, horisontaalsuunas eraldusvõime ca 0,2 nm, vertikaalsuunas eraldusvõime ca 0,01 nm.
  • microscope which uses a probe with an "atomic micro-tip" floated, using superconducting levitation, over the surface being scanned (see: electron microscope, atomic microtip)
    Good to know
    • The top/surface is of order of atomic diameters so that the electron current obtained is through quantum mechanical tunneling; a horizontal resolution of ca 0.2 nm and a vertical resulution of ca 0.01 nm is obtained.
skaneeriv tunnelmikroskoop preferred
skaneeriv tunnel-elektronmikroskoop
tunnelmikroskoop
STM abbreviation
scanning tunneling electron microscope
STM abbreviation

Materjalitehnika terminibaas

ID 676024 Last modified 06.01.2025
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Domain metallography
  • juhtivate pindade uurimistehnika, mis annab elektroonse kujutise resolutsiooniga alla 0,01 nm (vt teravikmikroskoopia)
  • a surface analysis technique for conducting surfaces that provides an image of the physical structure of the surface with resolution less than 0.01 nm (see: scanning probe microscopy)
tunnelmikroskoopia preferred
scanning tunneling microscopy preferred
STM abbreviation

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