et

teljesuunaline skaneering

1

Terminological databases

Metroloogia terminibaas

ID 1143255 Last modified 09.06.2026
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Domain metrologymeasuring procedures
teljesuunaline skanning preferred
  • mehaaniline või optiline nihe mõõteobjekti pinna ja pildioptika vahel
  • mechanical or optical displacement between the sample under inspection and the imaging optics
teljesuunaline skanning preferred
Usage examples
  • Pildioptika on tavaliselt rööpne mikroskoobi teljesuunalise skanningu tasandiga.
  • Kujutise optika optiline telg on tavaolukorras rööpne mikroskoobi telgskannimisega.
axial scan
Usage examples
  • The imaging optics is nominally parallel to the axial scan axis of the microscope.
  • The optical axis of the imaging optics is nominally parallel to the axial scan of the microscope.

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