et

skaneeriv elektronmikroskoop

1

Terminological databases

Metroloogia terminibaas

ID 590387 Last modified 11.04.2024
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Domain metrologymeasuring instruments
skaneeriv elektronmikroskoop preferred
scanning electron microscope preferred
  • mikroskoop, mis loob kujutise uuritavat proovi suure energiaga elektronikiire abil skaneerides
  • type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons
skaneeriv elektronmikroskoop preferred
Usage examples
  • Kõige tavalisemas skaneeriva elektronmikroskoobi režiimis tuvastatakse sekundaarse elektronkiire ergastatud aatomite poolt eralduvad sekundaarsed elektronid sekundaarse elektrondetektori abil.
scanning electron microscope preferred
Usage examples
  • In the most common scanning electron microscope mode, secondary electrons emitted by atoms excited by the electron beam are detected using a secondary electron detector.

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