en

line-profiling method

1

Terminological databases

Metroloogia terminibaas

ID 1143052 Last modified 30.01.2026
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Domain metrologymeasuring procedures
  • pinnatopograafia mõõtemeetod, mis annab mõõteandmetena pinna ebatasasuste kahemõõtmelise graafiku või profiili, mida võib matemaatiliselt esitada kõrgusfunktsioonina z(x)
  • surface topography measurement method that produces a two.dimensional graph or profile of the surface irregularities as measurement data, which may be represented mathematically as a height function z(x)
joonprofiilimeetod
Usage examples
  • Joonprofiilimeetodit mõõtmisel kasutatavateks mõõtevahenditeks on nt kontaktkompariga skanner, faasinihkega interferentsmõõtur ja optiline vaheprofiiler.
profiilimeetod
line-profiling method
Usage examples
  • Examples of instruments that were developed specifically to measure line-profiling methods include contact stylus scanning, eartly version of the phase-shifting interferometer, and the optical differential profiler.

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