en

lateral scanning system

1

Terminological databases

Metroloogia terminibaas

ID 1142930 Last modified 30.05.2026
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Domain metrologymeasuring procedures
  • süsteem, mis teostab mõõdetava pinna kõrgusskannimist/-kompamist x, y tasapinnal
  • system that performs the scanning of the surface to be measured in the (x, y) plane
kahesuunaline skannimissüsteem
Usage examples
  • Kahesuunaline pinnaskannimissüsteem koosneb sisuliselt pinnaskannimismõõtevahendi neljast komponendist, milleks on x-telje ajam, y-telje ajam, z-mõõtesond ja mõõteobjekti mõõdetav pind.
külgskannimissüsteem preferred
lateral scanning system
Usage examples
  • Lateral scanning system are essentially four components to a surface scanning instrument system: the x-axis drive, the y-axis drive, the z-measurement probe and the surface to be measured.

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