Mõõtevahendiga seonduvaks sisendsuuruseks on nt mõõtevahendi temperatuurijaotus ning selle ruumilised ja ajalised muutused, ja mõõtevahendi deformatsioonist tulenev pingejaotus, mis on tingitud katseseadmeks oleva vihi koormusest.
The distributed temperature – and its spatial and temporal gradients – of the indicating measuring instrument. The distributed strain due to deformation of the indicating measuring instrument induced by the load of the test equipment weight.
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