en

detection pattern

1

Terminological databases

Metroloogia terminibaas

ID 1143252 Last modified 19.05.2025
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Domain metrologymeasuring instrumentsmeasuring procedures
  • üksikute või korduvate kujutiste asetus, mis on paigutatud mikroskoobi objektiivi ühendkujutise asendisse, blokeerides mõõteobjekti pinnalt ja eelnevalt valgustatud osadelt peegelduvat fookusvälist valgust
  • arrangement of single or repetitive structures placed on a conjugate image position of the microscope's objective, blocking the out-of-focus light reflected from surface and from previously illuminated parts
tuvastusmuster
Usage examples
  • Valgustusmuster ja tuvastusmuster ei pea omama sama geomeetriat.
tuvastamismuster
detection pattern
Usage examples
  • The illumination and detection patterns need not have the same geometry.

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