en

background offset

1

Terminological databases

Metroloogia terminibaas

ID 1143267 Last modified 30.01.2026
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Domain metrologymeasuring procedures
taustanihe preferred
tausta nihe
  • teljesuunalise asenditevahelise telgtundlikkuse väärtus, mis on signaali maksimumasendist kaugel
  • value of the axial response for axial positions far from the maximum signal position
taustanihe preferred
Usage examples
  • Taustanihe võib olla põhjustatud peegeldunud ja hajutatud valgusest mõõtevahendis ja mõõteobjekti pinnalt.
tausta nihe
taustnihe
background offset
Usage examples
  • The background offset might be caused by residual reflected and scattered light within the instrument and from the sample.

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