pinna mõõtemeetod, mis esitab pinna topograafilise kujutise, mida saab matemaatiliselt esitada kahe sõltumatu muutuja (x, y) kõrgusfunktsioonina z(x, y)
surface measurement method that produces a topographical image of a surface, which may be represented mathematically as a height function z(x, y) of two independent variables (x, y)
Examples of areal-topography methods that have been developed or adapted for areal-topography measurements include stylus scanning, phase-shifting interferometric microscopy, coherence scanning interferometry, confocal microscopy. confocal chromatic microscopy, structured light projection, focus variation microscopy, optical differential profiler, digital holography microscopy, point autofocus profiling, angle-resolved scanning electron microscopy, SEM sterooscopy, scanning tunneling microscopy, and atomic force microscopy.
