asendini x määratletud profiili kujutisjoon, mis on saadud primaarprofiilist paigutusindeksiga Nic profiili L-filtri abil pika lainepikkusega külgmiste komponentide eraldamise tulemusel, scale-limited profile at any position x derived from the primary profile by removing large scale lateral components by a profile L-filter and with the same nesting index Nic and the same type of filter specified for the profile S-filter to obtain the waviness profile