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scanning tunneling microscopy

1

Terminological databases

Materjalitehnika terminibaas

ID 676024 Last modified 06.01.2025
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Domain metallography
tunnelmikroskoopia preferred
skaneeriv tunnelmikroskoopia
scanning tunneling microscopy preferred
STM
  • juhtivate pindade uurimistehnika, mis annab elektroonse kujutise resolutsiooniga alla 0,01 nm (vt teravikmikroskoopia)
  • a surface analysis technique for conducting surfaces that provides an image of the physical structure of the surface with resolution less than 0.01 nm (see: scanning probe microscopy)
tunnelmikroskoopia preferred
skaneeriv tunnelmikroskoopia
scanning tunneling microscopy preferred
STM abbreviation

Metroloogia terminibaas

ID 1143102 Last modified 29.01.2026
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Domain metrologymeasuring procedures
skanniv tunnelmikroskoopia preferred
skaneeriv tunnelmikroskoopia
skaneeriv tunnel-elektronmikroskoopia
STM
scanning tunneling microscopy
STM
  • pinnatopograafia mõõtemeetod, mille põhjal pinna kõrguse mõõtmine põhineb elektrit juhtiva pinna ja sellele väga lähedal asuva juhtiva teravikotsaku vahel tekkiva elektrilise tunnelivoolu kõrgusest tulenevatest kõikumistest, mille vahel hoitakse konstantset pinget
  • surface topography measurement method werebly the determination of surface height arises from the height-related variations in the electrical tunnelling current produced between a conducting surface and a conducting tip placed very close to it, with a constant voltage maintained between them
skanniv tunnelmikroskoopia preferred
Usage examples
  • Skanniv tunnelmikroskoopia kui mõõtemeetod võimaldab skannida viies väga terava metalltraadi otsa üle mõõtepinna pinnale väga lähedale ja rakendades traadi otsale või mõõdetavale pinnale elektrilist pinget, mille põhjal saab pinda kujutada äärmiselt väikeses skaalaulatuses kuni üksikute aatomite lahutamiseni.
skaneeriv tunnelmikroskoopia
skaneeriv tunnel-elektronmikroskoopia
STM abbreviation
tunnelmikroskoopia variant
scanning tunneling microscopy
Usage examples
  • Scanning tunneling microscopy as a measurement method allows scanning by moving the tip of a very sharp metal wire very close to the surface of the measurement surface and applying an electrical voltage to the tip of the wire or the surface being measured, which allows the surface to be imaged on an extremely small scale, down to the resolution of individual atoms.
STM abbreviation

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