en

illumination pattern

1

Terminological databases

Metroloogia terminibaas

ID 1143251 Last modified 02.06.2026
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Domain metrologymeasuring instrumentsmeasuring procedures
  • üksikute või korduvate kujutiste asetus, mis on paigutatud mikroskoobi objektiivi ühendkujutise asendisse (tavaliselt välimembraani asendisse), piirates mõõteobjekti pinna valgustatud osi
  • arrangement of single or repetitive structures placed on a conjugate image position of the microscope's objective (typically the field diaphragm position), restricting the illuminated parts on the sample
valgustusmuster
Usage examples
  • Valgustusmustriks võib olla nt üksik nõelauk, võrdsete vahedega avad ruudustikul, pilud, rööpsed pilud või mis tahes muu muster, mis vähendab tõhusalt valgustatud ala ulatust.
illumination pattern
Usage examples
  • The illumination pattern can be a single pinhole, equally spaced pinholes on a grid, slits, parallel slits or any other pattern that effectively reduces the amount of illuminated area.

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