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holographic interferometry

1

Terminological databases

Engineering, Manufacturing and Construction

Metroloogia terminibaas

ID 1200256 Last modified 06.11.2026
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Domain metrologymeasuring procedures
holograafiline interferents
HI
holographic interferometry
HI
  • mõõteprintsiip, mis võimaldab mõõta optiliselt kareda pinnaga objektide staatilisi ja dünaamilisi nihkeid optilise interferentsi määramatusega, st valguse lainepikkuse murdosa määramatusega
  • technique that enables the measurement of static and dynamic displacements of objects with optically rough surfaces at optical interferometric precision (i.e., to fractions of a wavelength of light)
holograafiline interferents
Usage examples
  • Holograafilisel interferomeetrial põhinevaid mõõtmisi saab rakendada pingete, deformatsioonide ja vibratsiooni analüüsil, samuti mittepurustavas kontrollis ja kiirgusdosimeetrias. Holograafilist interferentsi saab kasutada ka optilise teepikkuse muutuste tuvastamiseks läbipaistvates keskkondades, mis võimaldab nt visualiseerida ja analüüsida vedelike voolamist, ja kasutada pinna kuju kirjeldavate kontuurjoonte tekitamiseks.
HI abbreviation
holographic interferometry
Usage examples
  • Measurements based on the holographic interferometry can be applied to stress, strain, and vibration analysis, as well as to non-destructive testing and radiation dosimetry. It can also be used to detect optical path length variations in transparent media, which enables, for example, fluid flow to be visualized and analyzed. It can also be used to generate contours representing the form of the surface.
HI abbreviation

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