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сканирующий туннельный электронный микроскоп

1

Terminological databases

Materjalitehnika terminibaas

ID 672573 Last modified 13.08.2025
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Domain metallographylaboratory engineering
skaneeriv tunnelmikroskoop preferred
skaneeriv tunnel-elektronmikroskoop
tunnelmikroskoop
STM
scanning tunneling microscope preferred
scanning tunneling electron microscope
STM
  • elektronmikroskoop, mille korral aatomteravik „ujub“ üle skaneeritava pinna (vt elektronmikroskoop, aatomteravik)
    Good to know
    • Aatomteraviku mõõtmed mõne aatomläbimõõdu suurusjärgus, horisontaalsuunas eraldusvõime ca 0,2 nm, vertikaalsuunas eraldusvõime ca 0,01 nm.
  • microscope which uses a probe with an "atomic micro-tip" floated, using superconducting levitation, over the surface being scanned (see: electron microscope, atomic microtip)
    Good to know
    • The top/surface is of order of atomic diameters so that the electron current obtained is through quantum mechanical tunneling; a horizontal resolution of ca 0.2 nm and a vertical resulution of ca 0.01 nm is obtained.
skaneeriv tunnelmikroskoop preferred
skaneeriv tunnel-elektronmikroskoop
tunnelmikroskoop
STM abbreviation
scanning tunneling microscope preferred
scanning tunneling electron microscope
STM abbreviation

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