skaneeriv Augeri mikroskoop, skaneeriv augermikroskoop
an analytic device that measures the lateral distribution elements on the surface of a material by recording the intensity of their Auger electrons vs position of the electron beam, mikroskoop elementide lateraalse jaotuse mõõtmiseks materjali pinnal, registreerides Augeri elektronide intensiivsust vs elektronkiire positsioonile
