measurement standard that characterized by arithmetic mean height of the roughness profile (Ra) and maximum height of the roughness profile (Rz), and irregular ground profiles which are repeated everly 5λc in the longitudinal direction of the measurement standard, etalon, mida iseloomustavad pinnaprofiili iseloomustavad suurused Ra ja Rz, ning ebakorrapärane pinnaprofiil, mis kordub iga 5λc etaloni pealispinna pikisuunas, pinnakareduse mingit tunnussuurust reprodutseeriv kalibreeritud pinnakareduse mõõt, material measure for standards-compliant determination of surface roughness or surface structure