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value of the insulation resistance at which the device responds under specified conditions, isolatsioonitakistuse väärtus, millele mõõtevahend reageerib kindlaksmääratud tingimustel
arithmetical mean deviation from the mean line of the profile being measured, aritmeetiline keskmine hälve mõõdetava pinnaprofiili keskjoonest
real part of the impedance to earth, maandustakistuse tegeliku osise takitus
