measurement technique used to characterize the surface of crystalline materials by collecting information solely from the surface layer of the sample - a feature that distinguishes this method from other material characterization techniques also based on high-energy electron diffraction, mõõtemetoodika, mis on kasutusel kristalsete materjalide pinna iseloomustamiseks, kogudes teavet vaid proovi pinnakihist, mis eristab seda metoodikat teistest materjalide iseloomustamise metoodikatest, mis samuti põhinevad suure energiaga elektronide difraktsioonil